32.3.3.1.1 Accumulator Test
The Accumulator Test (ACCTEST) mode aids in diagnostics of the accumulator and result formatting hardware and can, combined with targeted input stimulus, achieve high fault coverage quickly. It is configured in the MODE bitfield in the Command (ADCn.COMMAND) register.
The Accumulator Test mode is used as follows:
- Writing to the SAMPLE (ADCn.SAMPLE) register writes directly to the internal 16-bit accumulator
- Writing to the RESULT (ADCn.RESULT) register will accumulate the written value in the internal 16-bit accumulator
- Reading the RESULT register will return the accumulated result
Note: If the Left Adjust (LEFTADJ) bit in the Control F (ADCn.CTRLF) register is
‘
1’, a value written to the RESULT register will be left adjusted
6-SAMPNUM bits before it is accumulated.