4.1 Four-Wire Interface
- Test Clock Input (TCK)
- Test Mode Select Input (TMS)
- Test Data Input (TDI)
- Test Data Output (TDO)
Device Pin Name | Pin Type | Pin Description |
---|---|---|
MCLR | Input | Programming enable |
ENVREG(2) | Input | Enable for on-chip voltage regulator |
VDD, VDDIO, VDDCORE(2), VDDR1V8(2), VBAT(2) and AVDD(1) | Power | Power supply |
VSS, VSS1V8(2) and AVSS(1) | Power | Ground |
VCAP(2) | Power | CPU logic filter capacitor connection |
TDI | Input | Test Data In |
TDO | Output | Test Data Out |
TCK | Input | Test Clock |
TMS | Input | Test Mode State |
Note:
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Test Clock Input (TCK)
TCK is the clock that controls the updating of the TAP controller and the shifting of data through the Instruction or selected Data registers. TCK is independent of the processor clock with respect to both frequency and phase.
Test Mode Select Input (TMS)
TMS is the control signal for the TAP controller. This signal is sampled on the rising edge of the TCK.
Test Data Input (TDI)
TDI is the test data input to the Instruction or selected Data register. This signal is sampled on the rising edge of the TCK for some TAP controller states.
Test Data Output (TDO)
TDO is the test data output from the Instruction or Data registers. This signal changes on the falling edge of TCK. TDO is only driven when data is shifted out, otherwise the TDO is tri-stated.