39.3.5 Memory Programming Specifications

Table 39-5. 
Standard Operating Conditions (unless otherwise stated)
Param
 No. Sym. Device Characteristics Min. Typ† Max. Units Conditions
High Voltage Entry Programming Mode Specifications
MEM01 VIHH Voltage on MCLR/VPP pin to enter Programming mode 8 9 V (Note 2, Note 3)
MEM02 IPPGM Current on MCLR/VPP pin during Programming mode 1 mA (Note 2)
Programming Mode Specifications
MEM10 VBE VDD for Bulk Erase V (Note 4)
MEM11 IDDPGM Supply Current during Programming operation 10 mA
Data EEPROM Memory Specifications
MEM20 ED DataEE Byte Endurance 100k E/W -40°C≤TA≤+85°C
MEM21 TD_RET Characteristic Retention 40 Year Provided no other specifications are violated
MEM22 ND_REF Total Erase/Write Cycles before Refresh 100k E/W
MEM23 VD_RW VDD for Read or Erase/Write operation VDDMIN VDDMAX V
MEM24 TD_BEW Byte Erase and Write Cycle Time 4.0 5.0 ms
Program Flash Memory Specifications
MEM30 EP Flash Memory Cell Endurance 10k E/W -40°C≤Ta≤+85°C


(Note 1)

MEM32 TP_RET Characteristic Retention 40 Year Provided no other specifications are violated
MEM33 VP_RD VDD for Read operation VDDMIN VDDMAX V
MEM34 VP_REW VDD for Row Erase or Write operation VDDMIN VDDMAX V
MEM35 TP_REW Self-Timed Row Erase or Self-Timed Write 2.0 2.8 ms

† - Data in “Typ” column is at 3.0V, 25°C unless otherwise stated. These parameters are for design guidance only and are not tested.

Note:
  1. Flash Memory Cell Endurance for the Flash memory is defined as: One Row Erase operation and one Self-Timed Write.
  2. Required only if CONFIG4, bit LVP is disabled.
  3. The MPLAB® ICD2 does not support variable VPP output. Circuitry to limit the ICD2 VPP voltage must be placed between the ICD2 and target system when programming or debugging with the ICD2.
  4. Refer to the “PIC16(L)F184XX Memory Programming Specification” document for description.