48.6.3 Digital-to-Analog Converter (DAC) Characteristics
| Symbol | Parameters | Conditions | Min. | Typ. | Max. | Unit | 
|---|---|---|---|---|---|---|
| AVREF | External reference voltage | 1 | - | VDDANA-0.6 | V | |
| Internal reference voltage 1 | - | 1 | - | V | ||
| Internal reference voltage 2 | - | VDDANA | - | V | ||
| Linear output voltage range | 0.05 | - | VDDANA-0.05 | V | ||
| Minimum resistive load | 5 | - | - | kOhm | ||
| Maximum capacitance load | - | - | 100 | pF | ||
| IDD | DC supply current(2) | Voltage pump disabled | - | 175 | 290 | µA | 
Note: 
            
- These values are based on simulation otherwise noted.
 - These values are based on characterization, and are not covered in test limits in production.
 
| Symbol | Parameter | Conditions | Min. | Typ. | Max. | Units | |
|---|---|---|---|---|---|---|---|
| RES | Input resolution | - | - | 10 | Bits | ||
| INL | Integral non-linearity | VREF= Ext 1.0V | VDD = 1.8V | +/-0,2 | +/-0,5 | +/-1.4 | LSB | 
| VDD = 3.63V | +/-0,2 | +/-0,4 | +/-1,2 | ||||
| VREF = VDDANA | VDD = 1.8V | +/-0,2 | +/-0,6 | +/-2.1 | |||
| VDD = 3.63V | +/-0,2 | +/-0,5 | +/-1,9 | ||||
| VREF= INT1V | VDD = 1.8V | +/-0,4 | +/-0,7 | +/-4.2 | |||
| VDD = 3.63V | +/-0,4 | +/-0,8 | +/-6 | ||||
| DNL | Differential non-linearity | VREF= Ext 1.0V | VDD = 1.8V | +/-0,1 | +/-0,3 | +/-2 | LSB | 
| VDD = 3.63V | +/-0,1 | +/-0,3 | +/-1.5 | ||||
| VREF= VDDANA | VDD = 1.8V | +/-0,1 | +/-0,2 | +/-3.0 | |||
| VDD = 3.63V | +/-0,1 | +/-0,2 | +/-1.6 | ||||
| VREF= INT1V | VDD = 1.8V | +/-0,3 | +/-0,6 | +/-4.3 | |||
| VDD = 3.63V | +/-0,3 | +/-0,8 | +/-7 | ||||
| Gain error | VREF= Ext 1.0V | - | +/-4 | +/-16 | mV | ||
| VREF= VDDANA | - | +/-12 | +/-60 | mV | |||
| VREF= INT1V | - | +/-1 | +/-23 | mV | |||
| Offset error | VREF= Ext 1.0V | - | +/-1 | +/-13 | mV | ||
| VREF= VDDANA | - | +/-2.5 | +/-32 | mV | |||
| VREF= INT1V | - | +/-1.5 | +/-30 | mV | 
Note: 
            
- All values are measured using a conversion rate of 350 ksps.
 - These values are based on characterization, and are not covered in test limits in production.
 
