4.3 BIST Overview

The dsPIC33CK512MPT608 family features a data memory Built-In Self-Test (BIST) that has the option to be run at start-up or run time. The memory test checks that all memory locations are functional and provides a pass/fail status of the RAM that can be used by software to take action if needed. If a failure is reported, the specific location(s) are not identified.

The MBISTCON register (MBISTCON) contains control and status bits for BIST operation. The MBISTDONE bit (MBISTCON[7]) indicates if a BIST was run since the last Reset and the MBISTSTAT bit (MBISTCON[4]) provides the pass fail result.