46.19 ADC
Operating Conditions:
| ||||||
---|---|---|---|---|---|---|
Symbol | Description | Min. | Typ. ✝ | Max. | Units | Conditions |
NR | Resolution | - | - | 10 | bit | |
EINL | Integral nonlinearity error | - | 0.1 | - | LSb | |
EDNL | Differential nonlinearity error(1) | - | 0.1 | - | LSb | |
EOFF | Offset error | - | 0.5 | - | LSb | |
EGAIN | Gain error | - | 0.2 | - | LSb | |
EABS | Absolute error | - | 0.8 | - | LSb | |
VADCREF * | ADC reference voltage | 1 | - | VDD | V | |
VAIN | Full-scale range | GND | - | VADCREF | V | |
ZAIN | Recommended impedance of ADC input voltage source | - | <10 | - | kΩ | |
RVREFA | ADC voltage reference ladder resistance(2) | - | 50 | - | kΩ | |
EVDD/10 | VDD/10 divider (VDDDIV10/VDDIO2DIV10) accuracy | - | ±10 | - | % | Measured with ADC using on-chip internal reference |
✝ Unless otherwise specified, data in the “Typ.” column is at TA = 25°C and VDD = 3.0V. These parameters are not tested and are for design guidance only. * These parameters are characterized but not tested in production. Note:
|
Symbol | Min. | Typ. ✝ | Max. | Units | Conditions | |
---|---|---|---|---|---|---|
TCLK_ADC * | ADC clock period | 0.5 | 8 | µs | ||
tCNV | Conversion time | 11.5×TCLK_ADC + 2×TCLK_PER | ||||
fADC * | Sample rate | 8 | 170 | ksps | ||
tSENSE * | Delay for changing MUXPOS to TEMP | 40 | µs | |||
tADC_INIT * | Initialization time | 6 | µs | |||
✝ Unless otherwise specified, data in the “Typ.” column is at TA = 25°C and VDD = 3.0V. These parameters are not tested and are for design guidance only. * These parameters are characterized but not tested in production. |