46.19 ADC
Operating Conditions:
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|---|---|---|---|---|---|---|
| Symbol | Description | Min. | Typ. ✝ | Max. | Units | Conditions |
| NR | Resolution | - | - | 10 | bit | |
| EINL | Integral nonlinearity error | - | 0.1 | - | LSb | |
| EDNL | Differential nonlinearity error(1) | - | 0.1 | - | LSb | |
| EOFF | Offset error | - | 0.5 | - | LSb | |
| EGAIN | Gain error | - | 0.2 | - | LSb | |
| EABS | Absolute error | - | 0.8 | - | LSb | |
| VADCREF * | ADC reference voltage | 1 | - | VDD | V | |
| VAIN | Full-scale range | GND | - | VADCREF | V | |
| ZAIN | Recommended impedance of ADC input voltage source | - | <10 | - | kΩ | |
| RVREFA | ADC voltage reference ladder resistance(2) | - | 50 | - | kΩ | |
| EVDD/10 | VDD/10 divider (VDDDIV10/VDDIO2DIV10) accuracy | - | ±10 | - | % | Measured with ADC using on-chip internal reference |
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✝ Unless otherwise specified, data in the “Typ.” column is at TA = 25°C and VDD = 3.0V. These parameters are not tested and are for design guidance only. * These parameters are characterized but not tested in production. Note:
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| Symbol | Min. | Typ. ✝ | Max. | Units | Conditions | |
|---|---|---|---|---|---|---|
| TCLK_ADC * | ADC clock period | 0.5 | 8 | µs | ||
| tCNV | Conversion time | 11.5×TCLK_ADC + 2×TCLK_PER | ||||
| fADC * | Sample rate | 8 | 170 | ksps | ||
| tSENSE * | Delay for changing MUXPOS to TEMP | 40 | µs | |||
| tADC_INIT * | Initialization time | 6 | µs | |||
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✝ Unless otherwise specified, data in the “Typ.” column is at TA = 25°C and VDD = 3.0V. These parameters are not tested and are for design guidance only. * These parameters are characterized but not tested in production. | ||||||
