Introduction
1 Definitions, Acronyms and Abbreviations
2 Overall Description
3 Metrology Interface Definition
- 3.1 Metrology Control Registers
  - 3.1.1 Metrology State Control
    Metrology State Control
  - 3.1.2 Metrology Feature Control Register
    Metrology Feature Control Register
  - 3.1.3 AFE Selection
    AFE Selection
  - 3.1.4 Channel Matrix Register
    Channel Matrix Register
  - 3.1.5 Harmonic Control Register
    Harmonic Control Register
  - 3.1.6 Meter Type Settings Register
    Meter Type Settings Register
  - 3.1.7 Number of Line Cycles for Integration Period
    Number of Line Cycles for Integration Period
  - 3.1.8 Max Number of Samples in an Integration Period
    Max Number of Samples in an Integration Period
  - 3.1.9 Pulse Control Register x (x = 0, 1, 2)
    Pulse Control Register x (x = 0, 1, 2)
  - 3.1.10 Pulse Meter Constant Register x (x = 0, 1, 2)
    Pulse Meter Constant Register x (x = 0, 1, 2)
  - 3.1.11 Synthesizer Address
    Synthesizer Address
  - 3.1.12 Creep Threshold for Active Energy
    Creep Threshold for Active Energy
  - 3.1.13 Per-Phase Creep Threshold for Active Energy
    Per-Phase Creep Threshold for Active Energy
  - 3.1.14 Creep Threshold for Quadergy
    Creep Threshold for Quadergy
  - 3.1.15 Per-Phase Creep Threshold for Reactive Energy
    Per-Phase Creep Threshold for Reactive Energy
  - 3.1.16 Creep Threshold of Phase Current
    Creep Threshold of Phase Current
  - 3.1.17 Per-Phase Creep Threshold of Phase Current
    Per-Phase Creep Threshold of Phase Current
  - 3.1.18 Creep Threshold for Apparent Energy
    Creep Threshold for Apparent Energy
  - 3.1.19 Power Offset Control Register
    Power Offset Control Register
  - 3.1.20 Active Power Offset Register
    Active Power Offset Register
  - 3.1.21 Reactive Power Offset Register
    Reactive Power Offset Register
  - 3.1.22 Apparent Power Offset Register
    Apparent Power Offset Register
  - 3.1.23 Voltage Swell Threshold
    Voltage Swell Threshold
  - 3.1.24 Voltage Sag Threshold
    Voltage Sag Threshold
  - 3.1.25 Voltage Interrupt Thresholds
    Voltage Interrupt Thresholds
  - 3.1.26 Current Conversion Factor
    Current Conversion Factor
  - 3.1.27 Voltage Conversion Factor
    Voltage Conversion Factor
  - 3.1.28 Current Channel Magnitude Calibration Constants
    Current Channel Magnitude Calibration Constants
  - 3.1.29 Voltage Channel Magnitude Calibration Constants
    Voltage Channel Magnitude Calibration Constants
  - 3.1.30 Per-Channel Phase Calibration Constants
    Per-Channel Phase Calibration Constants
  - 3.1.31 Waveform Capture Control Register
    Waveform Capture Control Register
  - 3.1.32 Capture Buffer Size
    Capture Buffer Size
  - 3.1.33 Waveform Capture Destination Buffer Address
    Waveform Capture Destination Buffer Address
  - 3.1.34 AFE Control 0 Register (For ATSENSE203/301)
    AFE Control 0 Register (For ATSENSE203/301)
  - 3.1.35 AFE Control 0 Register (For MCP3912/13/14)
    AFE Control 0 Register (For MCP3912/13/14)
  - 3.1.36 Per-Phase Active Power Offset Register
    Per-Phase Active Power Offset Register
  - 3.1.37 Per-Phase Reactive Power Offset Register
    Per-Phase Reactive Power Offset Register
- 3.2 Metrology Status Registers
- 3.3 Accumulated Output Quantities
- 3.4 Per-Cycle Accumulated Output Quantities
- 3.5 Harmonic Analysis Output Quantities
- 3.6 Derived Output Quantities
4 Interface between Metrology and Application
5 Annex – Meter Forms
The service type determines what meter form is being implemented and how the Metrology DSP core interprets and processes the ADC values.
6 References
7 Revision History
Microchip Information

3.1.17 Per-Phase Creep Threshold of Phase Current

These registers allow to establish different current thresholds for each one of the phases.

If the per-phase x (x = A, B or C) current is less than the threshold, then the corresponding accumulators (I_x, I_x_F) are reset to zero. This rule is applied to every single cycle.

This creep affects the power accumulators, the pulse accumulators and measurements. However, the generic creep (CREEP_THRESHOLD_I) affects only the pulse accumulators and measurements.

The CREEP_THRESHOLD_I_x is stored in the uQ12.20 format and the unit is mArms-scaled (normalized by K_I_x).

For example, for desired creep thresholds of 5 mA for phase A, 10 mA for phase B, and 15 mA for phase C (K_I_A = K_I_B = K_I_C = 617.28396), then:

CREEP_THRESHOLD_I_A = round [(5 / 617.28396) * 2²⁰] = 8493 = 0x0000212D
CREEP_THRESHOLD_I_B = round [(10 / 617.28396) * 2²⁰] = 16987 = 0x0000425B
CREEP_THRESHOLD_I_C = round [(15 / 617.28396) * 2²⁰] = 25840 = 0x000064F0

Name:	CREEP_THRESHOLD_I_x (x = A, B, C)
Property:	Read-Write


Bit	31	30	29	28	27	26	25	24
	CREEP_THRESHOLD_I_x[31:24]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0


Bit	23	22	21	20	19	18	17	16
	CREEP_THRESHOLD_I_x[23:16]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0


Bit	15	14	13	12	11	10	9	8
	CREEP_THRESHOLD_I_x[15:8]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0


Bit	7	6	5	4	3	2	1	0
	CREEP_THRESHOLD_I_x[7:0]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0

Bits 31:0 – CREEP_THRESHOLD_I_x[31:0] (uQ12.20)

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