Introduction
1 Definitions, Acronyms and Abbreviations
2 Overall Description
3 Metrology Interface Definition
- 3.1 Metrology Control Registers
  - 3.1.1 Metrology State Control
    Metrology State Control
  - 3.1.2 Metrology Feature Control Register
    Metrology Feature Control Register
  - 3.1.3 AFE Selection
    AFE Selection
  - 3.1.4 Channel Matrix Register
    Channel Matrix Register
  - 3.1.5 Harmonic Control Register
    Harmonic Control Register
  - 3.1.6 Meter Type Settings Register
    Meter Type Settings Register
  - 3.1.7 Number of Line Cycles for Integration Period
    Number of Line Cycles for Integration Period
  - 3.1.8 Max Number of Samples in an Integration Period
    Max Number of Samples in an Integration Period
  - 3.1.9 Pulse Control Register x (x = 0, 1, 2)
    Pulse Control Register x (x = 0, 1, 2)
  - 3.1.10 Pulse Meter Constant Register x (x = 0, 1, 2)
    Pulse Meter Constant Register x (x = 0, 1, 2)
  - 3.1.11 Synthesizer Address
    Synthesizer Address
  - 3.1.12 Creep Threshold for Active Energy
    Creep Threshold for Active Energy
  - 3.1.13 Per-Phase Creep Threshold for Active Energy
    Per-Phase Creep Threshold for Active Energy
  - 3.1.14 Creep Threshold for Quadergy
    Creep Threshold for Quadergy
  - 3.1.15 Per-Phase Creep Threshold for Reactive Energy
    Per-Phase Creep Threshold for Reactive Energy
  - 3.1.16 Creep Threshold of Phase Current
    Creep Threshold of Phase Current
  - 3.1.17 Per-Phase Creep Threshold of Phase Current
    Per-Phase Creep Threshold of Phase Current
  - 3.1.18 Creep Threshold for Apparent Energy
    Creep Threshold for Apparent Energy
  - 3.1.19 Power Offset Control Register
    Power Offset Control Register
  - 3.1.20 Active Power Offset Register
    Active Power Offset Register
  - 3.1.21 Reactive Power Offset Register
    Reactive Power Offset Register
  - 3.1.22 Apparent Power Offset Register
    Apparent Power Offset Register
  - 3.1.23 Voltage Swell Threshold
    Voltage Swell Threshold
  - 3.1.24 Voltage Sag Threshold
    Voltage Sag Threshold
  - 3.1.25 Voltage Interrupt Thresholds
    Voltage Interrupt Thresholds
  - 3.1.26 Current Conversion Factor
    Current Conversion Factor
  - 3.1.27 Voltage Conversion Factor
    Voltage Conversion Factor
  - 3.1.28 Current Channel Magnitude Calibration Constants
    Current Channel Magnitude Calibration Constants
  - 3.1.29 Voltage Channel Magnitude Calibration Constants
    Voltage Channel Magnitude Calibration Constants
  - 3.1.30 Per-Channel Phase Calibration Constants
    Per-Channel Phase Calibration Constants
  - 3.1.31 Waveform Capture Control Register
    Waveform Capture Control Register
  - 3.1.32 Capture Buffer Size
    Capture Buffer Size
  - 3.1.33 Waveform Capture Destination Buffer Address
    Waveform Capture Destination Buffer Address
  - 3.1.34 AFE Control 0 Register (For ATSENSE203/301)
    AFE Control 0 Register (For ATSENSE203/301)
  - 3.1.35 AFE Control 0 Register (For MCP3912/13/14)
    AFE Control 0 Register (For MCP3912/13/14)
  - 3.1.36 Per-Phase Active Power Offset Register
    Per-Phase Active Power Offset Register
  - 3.1.37 Per-Phase Reactive Power Offset Register
    Per-Phase Reactive Power Offset Register
- 3.2 Metrology Status Registers
- 3.3 Accumulated Output Quantities
- 3.4 Per-Cycle Accumulated Output Quantities
- 3.5 Harmonic Analysis Output Quantities
- 3.6 Derived Output Quantities
4 Interface between Metrology and Application
5 Annex – Meter Forms
The service type determines what meter form is being implemented and how the Metrology DSP core interprets and processes the ADC values.
6 References
7 Revision History
Microchip Information

3.1.11 Synthesizer Address

This register allows the user to provide samples to the metrology library, replacing the samples typically received from the ADCs. The register holds a 32-bit address that must point to a descriptor with the following structure.

typedef struct {
    DRV_METROLOGY_SYN_CONTROL control;
    uint32_t *pData;
    void *next;
} DRV_METROLOGY_SYN_DESCRIPTOR;

Where,

The pData field is a pointer to a table containing the samples.
The next field is a pointer to the next descriptor. If next is set to 0 (NULL), there are no additional descriptors.
The control field is a 32-bit value with the following structure.
```
typedef struct 
{
	unsigned int numSamples : 19;
	unsigned int channel : 5;
	unsigned int key : 8;
} DRV_METROLOGY_SYN_CONTROL;
```
Where,
- numSamples is the number of samples in the table
- channel indicates the physical channel associated with the samples
- key is a security field that must be set to 0x5A


Bits	Name	Description
0-18	`numSamples`	Number of samples in the table
19-23	`channel`	Physical channel number
24-31	`key`	Must be set to 0x5A

Descriptors are processed once the synthesizer is enabled (bit 13 of FEATURE_CTRL). To modify the descriptors, first disable the synthesizer, make the necessary changes, and then re-enable the synthesizer.

Name:	SYNTHESIZER_ADDR
Property:	Read-Write


Bit	31	30	29	28	27	26	25	24
	SYNTHESIZER_ADDR[31:24]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0


Bit	23	22	21	20	19	18	17	16
	SYNTHESIZER_ADDR[23:16]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0


Bit	15	14	13	12	11	10	9	8
	SYNTHESIZER_ADDR[15:8]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0


Bit	7	6	5	4	3	2	1	0
	SYNTHESIZER_ADDR[7:0]
Access	R/W	R/W	R/W	R/W	R/W	R/W	R/W	R/W
Reset	0	0	0	0	0	0	0	0

Bits 31:0 – SYNTHESIZER_ADDR[31:0]

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