43 Electrical Characteristics 85℃
Absolute maximum ratings are listed below. Exposure to these maximum rating conditions for extended periods may affect device reliability. Functional operation of the device at these or any other conditions, above the parameters indicated in the operation listings of this specification, is not implied.
| Ambient temperature under bias | -40°C to +85°C |
| Storage temperature | -60°C to +150°C |
| Voltage on VDD with respect to GND | -0.3V to +5.8V |
| Voltage on VDDIO with respect to GND | -0.3V to +5.8V |
| Voltage on any pin with respect to GND | -0.3V to (VDD/VDDIO+0.3V) |
| Voltage on VREFA with respect to VDDANA | -0.3V to (VDDANA-0.3V) |
| Maximum total current out of all GND pins | 129 mA |
| Maximum total current into all VDDIN, VDDANA, and VDDIOx pins (Note2) | 129 mA |
| Maximum output current sourced/sunk by any Low-Current Mode I/O pin | 10 mA |
| Maximum output current sourced/sunk by any High- Current Mode I/O pin | 20 mA |
| Maximum current sunk by all ports | 129 mA |
| Maximum current sourced by all ports (Note 2) | 129 mA |
| Maximum Junction Temperature | +105°C |
| Human Body Model (HBM) per JESD22-A114 | 2000 V |
| Charged Device Model (CDM) (ANSI/ESD STM 5.3.1) (All pins/Corner pins) | 500 V/750 V |
Note:
- Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions, above those indicated in the operation listings of this specification, is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability.
- Maximum allowable current is a function of device maximum power dissipation.